Discovery - University of Dundee - Online Publications

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  1. Fluorescence background suppression in Raman spectroscopy

    Mazilu, M., De Luca, A. C., Riches, A., Herrington, S. & Dholakia, K. 2010 2010 Conference on lasers and electro-optics (CLEO) and quantum electronics and laser science conference (QELS). New York: IEEE Computer Society, p. - 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  2. Gaussian to Lorentzian Beam Profile Convertor Based on Conical Refraction

    Abdolvand, A., Wilcox, K. G., Kalkandjiev, T. K., Loiko, Y., Mompart, J. & Rafailov, E. U. 2010 2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS). NEW YORK: IEEE Computer Society, p. - 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  3. High quality electron beams from a laser wakefield accelerator

    Wiggins, M., Shanks, R., Issac, R., Welsh, G., Anania, M. P., Brunetti, E., Vieux, G., Cipiccia, S., Ersfeld, B., Islam, R., Burgess, R., Manahan, G., Aniculaesei, C., Gillespie, A., MacLeod, A. & Jaroszynski, D. 2010 2010 Conference on Lasers and Electro-Optics (CLEO) and Quantum Electronics and Laser Science Conference (QELS). NEW YORK: IEEE Computer Society, p. - 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  4. Improving SIFT-based descriptors stability to rotations

    Bellavia, F., Tegolo, D. & Trucco, E. 2010 2010 20th International Conference on Pattern Recognition, ICPR 2010: proceedings. Piscataway: IEEE Computer Society, p. 3460-3463 4 p. (International Conference on Pattern Recognition)

    Research output: Chapter in Book/Report/Conference proceedingOther chapter contribution

  5. Laser assisted microstructuring of amorphous silicon for microelectronics

    Halim, M. M., Abdolvand, A., Fan, Y., Persheyev, S. K., Main, C., Rafailov, E. U. & Rose, M. J. 2010 2010 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) AND QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (QELS). NEW YORK: IEEE Computer Society, p. 1-2 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  6. New tapered quantum-dot mode-locked laser diode with high peak power, low divergence and good beam quality

    Ruiz, M., Michel, N., Calligaro, M., Robert, Y., Krakowski, M., Nikitichev, D. I., Cataluna, M. A., Livshits, D. & Rafailov, E. U. 2010 Semiconductor Laser Conference (ISLC), 2010 22nd IEEE International . NEW YORK: IEEE Computer Society, p. 170-171 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  7. Study on fatigue feature from forearm SEMG signal based on wavelet analysis

    Wan, B., Xu, L., Ren, Y., Wang, L., Qiu, S., Liu, X., Liu, X., Qi, H., Ming, D. & Wang, W. 2010 2010 IEEE International Conference on Robotics and Biomimetics, ROBIO 2010. Piscataway: IEEE Computer Society, p. 1229-1232 4 p.

    Research output: Chapter in Book/Report/Conference proceedingOther chapter contribution

  8. Super resolution reconstruction based on total variation regularization

    Wan, B., Zeng, H., Yi, W., Ma, L., Xu, R., Zheng, X., Bai, Y., Qi, H., Ming, D. & Wang, W. 2010 2010 IEEE International Conference on Robotics and Biomimetics, ROBIO 2010. Piscataway: IEEE Computer Society, p. 1194-1199 6 p.

    Research output: Chapter in Book/Report/Conference proceedingOther chapter contribution

  9. Wavelength tuning In quantum dot semiconductor disc lasers

    Butkus, M., Hamilton, C. J., Malcolm, G. P. A., Krestnikov, I., Livshits, D. & Rafailov, E. U. 2010 Semiconductor Laser Conference (ISLC), 2010 22nd IEEE International . New York: IEEE Computer Society, p. 79-80 2 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

  10. Application of matching structures to identify the source of systematic dimensional offsets in GHOST proximity Corrected photomasks

    Smith, S., Tsiamis, A., McCallum, M., Hourd, A. C., Stevenson, J. T. M. & Walton, A. J. 14 Apr 2009 IEEE International Conference on Microelectronic Test Structures. IEEE Computer Society, p. 50-55 6 p.

    Research output: Chapter in Book/Report/Conference proceedingOther chapter contribution

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