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Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

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Authors

  • D. J. Keeble
  • S. Wicklein
  • R. Dittmann
  • L. Ravelli
  • R. A. Mackie
  • W. Egger

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Original languageEnglish
Article number226102
Pages-
Number of pages4
JournalPhysical Review Letters
Journal publication date23 Nov 2010
Volume105
Issue22
DOIs
StatePublished

Abstract

Cation vacancies on both sublattices (V-Ti, V-Sr) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr similar to 1 value, the concentration ratio [V-Sr]/[V-Ti] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than similar to 50 ppm were observed in all films.

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