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Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

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Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films. / Keeble, D. J. ; Wicklein, S.; Dittmann, R.; Ravelli, L.; Mackie, R. A.; Egger, W.

In: Physical Review Letters, Vol. 105, No. 22, 226102, 23.11.2010, p. -.

Research output: Contribution to journalArticle

Harvard

Keeble, DJ, Wicklein, S, Dittmann, R, Ravelli, L, Mackie, RA & Egger, W 2010, 'Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films' Physical Review Letters, vol 105, no. 22, 226102, pp. -.

APA

Keeble, D. J., Wicklein, S., Dittmann, R., Ravelli, L., Mackie, R. A., & Egger, W. (2010). Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films. Physical Review Letters, 105(22), -[226102]doi: 10.1103/PhysRevLett.105.226102

Vancouver

Keeble DJ, Wicklein S, Dittmann R, Ravelli L, Mackie RA, Egger W. Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films. Physical Review Letters. 2010 Nov 23;105(22):-. 226102.

Author

Keeble, D. J. ; Wicklein, S.; Dittmann, R.; Ravelli, L.; Mackie, R. A.; Egger, W. / Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films.

In: Physical Review Letters, Vol. 105, No. 22, 226102, 23.11.2010, p. -.

Research output: Contribution to journalArticle

Bibtex - Download

@article{2c0dae77ee734bf0b75b57400cfdf412,
title = "Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films",
author = "Keeble, {D. J.} and S. Wicklein and R. Dittmann and L. Ravelli and Mackie, {R. A.} and W. Egger",
year = "2010",
volume = "105",
number = "22",
pages = "--",
journal = "Physical Review Letters",
issn = "0031-9007",

}

RIS (suitable for import to EndNote) - Download

TY - JOUR

T1 - Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

A1 - Keeble,D. J.

A1 - Wicklein,S.

A1 - Dittmann,R.

A1 - Ravelli,L.

A1 - Mackie,R. A.

A1 - Egger,W.

AU - Keeble,D. J.

AU - Wicklein,S.

AU - Dittmann,R.

AU - Ravelli,L.

AU - Mackie,R. A.

AU - Egger,W.

PY - 2010/11/23

Y1 - 2010/11/23

N2 - <p>Cation vacancies on both sublattices (V-Ti, V-Sr) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr similar to 1 value, the concentration ratio [V-Sr]/[V-Ti] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than similar to 50 ppm were observed in all films.</p>

AB - <p>Cation vacancies on both sublattices (V-Ti, V-Sr) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr similar to 1 value, the concentration ratio [V-Sr]/[V-Ti] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than similar to 50 ppm were observed in all films.</p>

KW - SRTIO3

KW - ELECTRONICS

U2 - 10.1103/PhysRevLett.105.226102

DO - 10.1103/PhysRevLett.105.226102

M1 - Article

JO - Physical Review Letters

JF - Physical Review Letters

SN - 0031-9007

IS - 22

VL - 105

SP - -

ER -

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