Out of Focus Ultrafast Processing of Metals for Reduced Secondary Electron Yield

Dataset

Description

Data related to the optical materials express publication 'Out of Focus Ultrafast Processing of Metals for Reduced Secondary Electron Yield', including relevant beam images, raw damage threshold and secondary electron yield measurements.
Date made available23 Mar 2023
PublisherUniversity of Dundee
Date of data production1 Jun 2021 - 31 Dec 2022

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