Data related to the optical materials express publication 'Out of Focus Ultrafast Processing of Metals for Reduced Secondary Electron Yield', including relevant beam images, raw damage threshold and secondary electron yield measurements.
Uren, R. (Creator) (23 Mar 2023). Out of Focus Ultrafast Processing of Metals for Reduced Secondary Electron Yield. University of Dundee. DOE_Paper_Public_Data(.zip). 10.15132/10000196