Reynolds, Stephen

Dr

  • 944 Citations
  • 16 h-Index
1980 …2019
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Physics & Astronomy

Aeronautics

photocurrents

Physics

photoconductivity
temperature
electrons
noise spectra
photons
valence

Chemistry and Materials

amorphous silicon
silicon
wire

General

amorphous semiconductors
defects
thin films
decay
electron tunneling
silicon films
conductivity
probes
electronics
energy
transit
conduction
illumination
tunnel junctions
cells
filaments
degradation
simulation
computerized simulation
Laplace transformation
unity
escape
recovery
vapor deposition
soaking
profiles
Fourier transformation

Engineering

trapping
solar cells
conduction bands
traps
direct current
alternating current
excitation
vibration mode
life (durability)
dark current
high resolution
diodes

Aerospace Sciences

spectroscopy

Engineering & Materials Science

Photocurrents
Photoconductivity
Amorphous silicon
Microcrystalline silicon
Amorphous semiconductors
Defects
Electron tunneling
Spectroscopy
Semiconductor materials
Thin films
Defect density
Crystalline materials
Silicon
Electronic density of states
Silicon solar cells
Carrier transport
Laplace transforms
Conduction bands
Temperature
Plasma enhanced chemical vapor deposition
Tunnel junctions
Equivalent circuits
Degradation
Depth profiling
Computer simulation
Studios
Carrier lifetime
Doping (additives)
Silanes
Phase shift
Valence bands
Fourier transforms
Electronic properties
Adsorption
Adhesives
Solar cells
Oxides
Timber
Nanocrystals
Aging of materials
Solar energy
Photons
Electric potential
Wire
Recovery
Volume fraction
Electronic structure
Macros
Delta functions
Crystal atomic structure

Chemical Compounds

Photocurrents
Photoconductivity
Amorphous silicon
Microcrystalline silicon
Defects
Silicon
Spectroscopy
Electron tunneling
Amorphous semiconductors
Defect density
Semiconductor materials
Thin films
Crystalline materials
Electronic density of states
Carrier transport
Laplace transforms
Conduction bands
Temperature
Silicon solar cells
Silanes
Plasma enhanced chemical vapor deposition
Oxides
Depth profiling
Computer simulation
Tunnel junctions
Valence bands
Fourier transforms
Degradation
Electronic properties
Adsorption
Adhesives
Nanocrystals
Aging of materials
Aluminum
Equivalent circuits
Wire
Recovery
Volume fraction
Doping (additives)
Delta functions
Structural properties