Reynolds, Stephen

Dr

  • 944 Citations
  • 16 h-Index
1980 …2019
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Research Output 1980 2019

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Special issue
2003
2 Citations (Scopus)

Spatial and energetic profiling of defects in thin-film silicon

Reynolds, S., Main, C. & Bruggemann, R., 2003, In : Journal of Materials Science: Materials in Electronics. 44, 10-12

Research output: Contribution to journalSpecial issue

Silicon
Photocurrents
Calibration
Thin films
Defects