A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC

Ahmet T. Erdogan; Richard Walker; Neil Finlayson; Nikola Krstajic; Gareth O.S. Williams; Robert K. Henderson

doi:10.23919/VLSIC.2017.8008513

A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC

Ahmet T. Erdogan, Richard Walker, Neil Finlayson, Nikola Krstajic, Gareth O.S. Williams, Robert K. Henderson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

40 Citations (Scopus)

Abstract

A 1024 × 8 single photon avalanche diode (SPAD) based line sensor for time resolved spectroscopy is implemented in 0.13 μm imaging CMOS with 23.78 μm pixel pitch at 49.31% fill factor. The line sensor can operate in single photon counting (SPC) mode (65 giga-events/s), time-correlated single photon counting (TCSPC) mode (194 million events/s) or histogramming mode (16.5 giga-events/s), increasing the count rate up to 85 times compared to TCSPC operation. This performance is enabled by a 512 channel histogramming TDC with 50ps-6.4ns/bin zoomable time resolution.

Original language	English
Title of host publication	2017 Symposium on VLSI Circuits
Subtitle of host publication	Digest of Technical Papers
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	C292-C293
Number of pages	2
ISBN (Electronic)	9784863486065
ISBN (Print)	9781509039807
DOIs	https://doi.org/10.23919/VLSIC.2017.8008513
Publication status	Published - 15 Aug 2017
Event	31st Symposium on VLSI Circuits, VLSI Circuits 2017 - Kyoto, Japan Duration: 5 Jun 2017 → 8 Jun 2017

Conference

Conference	31st Symposium on VLSI Circuits, VLSI Circuits 2017
Country/Territory	Japan
City	Kyoto
Period	5/06/17 → 8/06/17

Keywords

CMOS
Histogramming
SPAD
TCSPC
Time-resolved spectroscopy

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Electrical and Electronic Engineering

Access to Document

10.23919/VLSIC.2017.8008513

Cite this

Erdogan, A. T., Walker, R., Finlayson, N., Krstajic, N., Williams, G. O. S., & Henderson, R. K. (2017). A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC. In 2017 Symposium on VLSI Circuits: Digest of Technical Papers (pp. C292-C293). Article 8008513 Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.23919/VLSIC.2017.8008513

@inproceedings{a0b0adb8feb945f09f68782c40012365,

title = "A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC",

abstract = "A 1024 × 8 single photon avalanche diode (SPAD) based line sensor for time resolved spectroscopy is implemented in 0.13 μm imaging CMOS with 23.78 μm pixel pitch at 49.31% fill factor. The line sensor can operate in single photon counting (SPC) mode (65 giga-events/s), time-correlated single photon counting (TCSPC) mode (194 million events/s) or histogramming mode (16.5 giga-events/s), increasing the count rate up to 85 times compared to TCSPC operation. This performance is enabled by a 512 channel histogramming TDC with 50ps-6.4ns/bin zoomable time resolution.",

keywords = "CMOS, Histogramming, SPAD, TCSPC, Time-resolved spectroscopy",

author = "Erdogan, {Ahmet T.} and Richard Walker and Neil Finlayson and Nikola Krstajic and Williams, {Gareth O.S.} and Henderson, {Robert K.}",

year = "2017",

month = aug,

day = "15",

doi = "10.23919/VLSIC.2017.8008513",

language = "English",

isbn = "9781509039807",

pages = "C292--C293",

booktitle = "2017 Symposium on VLSI Circuits",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

address = "United States",

note = "31st Symposium on VLSI Circuits, VLSI Circuits 2017 ; Conference date: 05-06-2017 Through 08-06-2017",

}

Erdogan, AT, Walker, R, Finlayson, N, Krstajic, N, Williams, GOS & Henderson, RK 2017, A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC. in 2017 Symposium on VLSI Circuits: Digest of Technical Papers., 8008513, Institute of Electrical and Electronics Engineers Inc., pp. C292-C293, 31st Symposium on VLSI Circuits, VLSI Circuits 2017, Kyoto, Japan, 5/06/17. https://doi.org/10.23919/VLSIC.2017.8008513

A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC. / Erdogan, Ahmet T.; Walker, Richard; Finlayson, Neil et al.
2017 Symposium on VLSI Circuits: Digest of Technical Papers. Institute of Electrical and Electronics Engineers Inc., 2017. p. C292-C293 8008513.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AU - Erdogan, Ahmet T.

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AU - Finlayson, Neil

AU - Krstajic, Nikola

AU - Williams, Gareth O.S.

AU - Henderson, Robert K.

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AB - A 1024 × 8 single photon avalanche diode (SPAD) based line sensor for time resolved spectroscopy is implemented in 0.13 μm imaging CMOS with 23.78 μm pixel pitch at 49.31% fill factor. The line sensor can operate in single photon counting (SPC) mode (65 giga-events/s), time-correlated single photon counting (TCSPC) mode (194 million events/s) or histogramming mode (16.5 giga-events/s), increasing the count rate up to 85 times compared to TCSPC operation. This performance is enabled by a 512 channel histogramming TDC with 50ps-6.4ns/bin zoomable time resolution.

KW - CMOS

KW - Histogramming

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KW - TCSPC

KW - Time-resolved spectroscopy

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DO - 10.23919/VLSIC.2017.8008513

M3 - Conference contribution

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SP - C292-C293

BT - 2017 Symposium on VLSI Circuits

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 31st Symposium on VLSI Circuits, VLSI Circuits 2017

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ER -

A 16.5 giga events/s 1024 × 8 SPAD line sensor with per-pixel zoomable 50ps-6.4ns/bin histogramming TDC

Abstract

Conference

Keywords

ASJC Scopus subject areas

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