The technology for producing DNA profiles is very sensitive and is able to produce profiles from process negative controls typically consisting of one or two peaks, a phenomenon known as dropin. There are several types of models that implement likelihood ratios for the statistical evaluation of DNA profiles. One of the types is the family of continuous models because they consider continuous peak height/area measurements from the stain profile. Nowadays, there are several continuous models available. The aim of this article is to expose a statistical model for dropin peak heights supported by data, and illustrate its incorporation into a continuous method.