A Novel ‘Metamaterial’ for Electro-Optic Electron Bunch Profile Monitors

Mateusz Tyrk, Amin Abdolvand, Allan Gillespie, Svetlana A. Zolotovskaya, E. W. Snedden

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Current techniques for ultra-short electron bunch profiles allow the measurement of ~60-fs (rms) electron bunches. Future electron and photon sources will generate bunches in the 1-5 fs regime and even shorter, and therefore new methods need to be devised to characterise such ultra-short bunches with good precision. We present a novel electro-optic (EO) material in the form of metallic nanoparticles embedded in glass substrates (metal-glass nanocomposites – MGNs) for future use in EO monitors. Uniform shape modification of the nanoparticles from spherical to spheroidal shapes led to changes in the surface plasmon resonance (SPR) band of the nanoparticles. Second harmonic generation (SHG) - as an indicator of a first-order EO effect – in both transmission and reflection geometries has been observed on excitation by a polarised 10 ps pulsed laser beam at 1064 nm with a repetition rate of 200 kHz. This new ‘metamaterial’ shows promising results for future measurements of ultra-short electron bunches, due to the SPR enhancement of the electro-optical coefficients.
Original languageEnglish
Title of host publicationProceedings of the 36th International Free Electron Laser Conference
EditorsJan Chrin, Sven Reiche, Volker R. W. Schaa
PublisherJACoW
Publication statusPublished - 2014
Event36th International Free Electron Laser Conference - Congress Center Basel, Basel, Switzerland
Duration: 25 Aug 201429 Aug 2014

Workshop

Workshop36th International Free Electron Laser Conference
Abbreviated titleFEL2014
CountrySwitzerland
CityBasel
Period25/08/1429/08/14

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