Current techniques for ultra-short electron bunch profiles allow the measurement of ~60-fs (rms) electron bunches. Future electron and photon sources will generate bunches in the 1-5 fs regime and even shorter, and therefore new methods need to be devised to characterise such ultra-short bunches with good precision. We present a novel electro-optic (EO) material in the form of metallic nanoparticles embedded in glass substrates (metal-glass nanocomposites – MGNs) for future use in EO monitors. Uniform shape modification of the nanoparticles from spherical to spheroidal shapes led to changes in the surface plasmon resonance (SPR) band of the nanoparticles. Second harmonic generation (SHG) - as an indicator of a first-order EO effect – in both transmission and reflection geometries has been observed on excitation by a polarised 10 ps pulsed laser beam at 1064 nm with a repetition rate of 200 kHz. This new ‘metamaterial’ shows promising results for future measurements of ultra-short electron bunches, due to the SPR enhancement of the electro-optical coefficients.
|Title of host publication||Proceedings of the 36th International Free Electron Laser Conference|
|Editors||Jan Chrin, Sven Reiche, Volker R. W. Schaa|
|Publication status||Published - 2014|
|Event||36th International Free Electron Laser Conference - Congress Center Basel, Basel, Switzerland|
Duration: 25 Aug 2014 → 29 Aug 2014
|Workshop||36th International Free Electron Laser Conference|
|Period||25/08/14 → 29/08/14|
Tyrk, M., Abdolvand, A., Gillespie, A., Zolotovskaya, S. A., & Snedden, E. W. (2014). A Novel ‘Metamaterial’ for Electro-Optic Electron Bunch Profile Monitors. In J. Chrin, S. Reiche, & V. R. W. Schaa (Eds.), Proceedings of the 36th International Free Electron Laser Conference [THP086] JACoW.