Abstract
A modified inelastic electron tunnelling spectrometer is described which enables data to be stored in digital form in a microcomputer. Subsequent numerical analysis may then be carried out with considerable flexibility and convenience. Presentation of data is possible, not only in second derivative form as in a conventional spectrometer, but also as a third derivative by a simple numerical technique. Examples of data presented in both forms are given for a tunnel junction consisting of Al/AlOx/benzoic acid/Pb. In addition, the third derivative technique is used to subtract a rising background from the second derivative spectrum of an Al/AIOx/benzoic acid/Au tunnel junction.
| Original language | English |
|---|---|
| Pages (from-to) | 217-221 |
| Number of pages | 5 |
| Journal | Surface and Interface Analysis |
| Volume | 2 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1980 |