An adaptive optics 3D STED microscope for super-resolution imaging of thick samples with background noise suppression using digital image processing

Piotr Zdankowski, MacIej Trusiak, Maria Cywinska, Jason R. Swedlow

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The emerge of super-resolution (SR) microscopy enabled imaging below the diffraction barrier. One of the SR techniques, Stimulated Emission Depletion (STED) microscopy, has shown promise in super-resolution imaging of thick specimen. Imaging such structures is a non-trivial task due to the increased aberrations introduced by the sample. Adaptive optics provides the solution to this problem. AO can correct the aberrations by modulation of the phase. Although STED microscopy is theoretically a diffraction unlimited technique, the resolution limiting factor is noise. Modern filtering techniques, such as block matching and 3D filtering (BM3D), can increase the signal-to-noise ratio of the STED images. This work presents an AO 3D STED microscope with aberration correction and background noise filtering using BM3D algorithm. We show the super-resolution images of thick samples and emphasize the importance of image processing for recovering of object high spatial frequencies.

Original languageEnglish
Title of host publicationSpeckle 2018
Subtitle of host publicationVII International Conference on Speckle Metrology
EditorsLeszek R. Jaroszewicz, Malgorzata Kujawinska
Place of PublicationWashington
PublisherSPIE-International Society for Optical Engineering
Number of pages9
Volume10834
ISBN (Electronic)9781510622982
ISBN (Print)9781510622975
DOIs
Publication statusPublished - 1 Jan 2018
Event7th International Conference on Speckle Metrology, Speckle 2018 - Janow Podlaski, Poland
Duration: 10 Sep 201812 Sep 2018

Publication series

NameSPIE Proceedings
PublisherInternational Society for Optical Engineering
Volume10834
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference7th International Conference on Speckle Metrology, Speckle 2018
CountryPoland
CityJanow Podlaski
Period10/09/1812/09/18

Keywords

  • Adaptive Optics
  • Fluorescence microscopy
  • Image Processing
  • Super-resolution microscopy

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