An adaptive optics 3D STED microscope for super-resolution imaging of thick samples with background noise suppression using digital image processing

Piotr Zdankowski, MacIej Trusiak, Maria Cywinska, Jason R. Swedlow

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)

    Abstract

    The emerge of super-resolution (SR) microscopy enabled imaging below the diffraction barrier. One of the SR techniques, Stimulated Emission Depletion (STED) microscopy, has shown promise in super-resolution imaging of thick specimen. Imaging such structures is a non-trivial task due to the increased aberrations introduced by the sample. Adaptive optics provides the solution to this problem. AO can correct the aberrations by modulation of the phase. Although STED microscopy is theoretically a diffraction unlimited technique, the resolution limiting factor is noise. Modern filtering techniques, such as block matching and 3D filtering (BM3D), can increase the signal-to-noise ratio of the STED images. This work presents an AO 3D STED microscope with aberration correction and background noise filtering using BM3D algorithm. We show the super-resolution images of thick samples and emphasize the importance of image processing for recovering of object high spatial frequencies.

    Original languageEnglish
    Title of host publicationSpeckle 2018
    Subtitle of host publicationVII International Conference on Speckle Metrology
    EditorsLeszek R. Jaroszewicz, Malgorzata Kujawinska
    Place of PublicationWashington
    PublisherSPIE-International Society for Optical Engineering
    Number of pages9
    Volume10834
    ISBN (Electronic)9781510622982
    ISBN (Print)9781510622975
    DOIs
    Publication statusPublished - 1 Jan 2018
    Event7th International Conference on Speckle Metrology, Speckle 2018 - Janow Podlaski, Poland
    Duration: 10 Sept 201812 Sept 2018

    Publication series

    NameSPIE Proceedings
    PublisherInternational Society for Optical Engineering
    Volume10834
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    Conference7th International Conference on Speckle Metrology, Speckle 2018
    Country/TerritoryPoland
    CityJanow Podlaski
    Period10/09/1812/09/18

    Keywords

    • Adaptive Optics
    • Fluorescence microscopy
    • Image Processing
    • Super-resolution microscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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