Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. A. Gillespie, S. P. Jamison, E.-A. Knabbe, A. M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmüser, B. Steffen

    Research output: Contribution to journalArticlepeer-review

    126 Citations (Scopus)


    The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society
    Original languageEnglish
    Pages (from-to)164801-1-164801-5
    JournalPhysical Review Letters
    Publication statusPublished - Oct 2007


    • Electron beams
    • Charge distribution
    • Electrooptical devices
    • Ultrashort pulses
    • Coulomb field
    • Electrooptic monitors
    • Radio-frequency structure


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