Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden; W. A. Gillespie; S. P. Jamison; E.-A. Knabbe; A. M. MacLeod; A. F. G. van der Meer; P. J. Phillips; H. Schlarb; B. Schmidt; P. Schmüser; B. Steffen

doi:10.1103/PhysRevLett.99.164801

Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. A. Gillespie, S. P. Jamison, E.-A. Knabbe, A. M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmüser, B. Steffen

Research output: Contribution to journal › Article › peer-review

126 Citations (Scopus)

Abstract

The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society

Original language	English
Pages (from-to)	164801-1-164801-5
Journal	Physical Review Letters
Volume	99
DOIs	https://doi.org/10.1103/PhysRevLett.99.164801
Publication status	Published - Oct 2007

Keywords

Electron beams
Charge distribution
Electrooptical devices
Ultrashort pulses
Coulomb field
Electrooptic monitors
Radio-frequency structure

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10.1103/PhysRevLett.99.164801

http://link.aps.org/doi/10.1103/PhysRevLett.99.164801

Cite this

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title = "Benchmarking of electro-optic monitors for femtosecond electron bunches",

abstract = "The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. {\textcopyright} 2007 The American Physical Society",

keywords = "Electron beams, Charge distribution, Electrooptical devices, Ultrashort pulses, Coulomb field, Electrooptic monitors, Radio-frequency structure",

author = "G. Berden and Gillespie, {W. A.} and Jamison, {S. P.} and E.-A. Knabbe and MacLeod, {A. M.} and {van der Meer}, {A. F. G.} and Phillips, {P. J.} and H. Schlarb and B. Schmidt and P. Schm{\"u}ser and B. Steffen",

note = "dc.publisher: American Physical Society dc.description.sponsorship: RCUK alpha-X program FOM/NWO ",

year = "2007",

month = oct,

doi = "10.1103/PhysRevLett.99.164801",

language = "English",

volume = "99",

pages = "164801--1--164801--5",

journal = "Physical Review Letters",

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publisher = "American Physical Society",

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TY - JOUR

T1 - Benchmarking of electro-optic monitors for femtosecond electron bunches

AU - Berden, G.

AU - Gillespie, W. A.

AU - Jamison, S. P.

AU - Knabbe, E.-A.

AU - MacLeod, A. M.

AU - van der Meer, A. F. G.

AU - Phillips, P. J.

AU - Schlarb, H.

AU - Schmidt, B.

AU - Schmüser, P.

AU - Steffen, B.

N1 - dc.publisher: American Physical Society dc.description.sponsorship: RCUK alpha-X program FOM/NWO

PY - 2007/10

Y1 - 2007/10

N2 - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society

AB - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society

KW - Electron beams

KW - Charge distribution

KW - Electrooptical devices

KW - Ultrashort pulses

KW - Coulomb field

KW - Electrooptic monitors

KW - Radio-frequency structure

U2 - 10.1103/PhysRevLett.99.164801

DO - 10.1103/PhysRevLett.99.164801

M3 - Article

SN - 0031-9007

VL - 99

SP - 164801-1-164801-5

JO - Physical Review Letters

JF - Physical Review Letters

ER -

Benchmarking of electro-optic monitors for femtosecond electron bunches

Abstract

Keywords

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