Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. A. Gillespie, S. P. Jamison, E.-A. Knabbe, A. M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmüser, B. Steffen

    Research output: Contribution to journalArticle

    100 Citations (Scopus)

    Abstract

    The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society
    Original languageEnglish
    Pages (from-to)164801-1-164801-5
    JournalPhysical Review Letters
    Volume99
    DOIs
    Publication statusPublished - Oct 2007

    Fingerprint

    electro-optics
    monitors
    electrons
    x ray lasers
    free electron lasers
    charge distribution
    shot
    radio frequencies
    detectors
    profiles

    Keywords

    • Electron beams
    • Charge distribution
    • Electrooptical devices
    • Ultrashort pulses
    • Coulomb field
    • Electrooptic monitors
    • Radio-frequency structure

    Cite this

    Berden, G., Gillespie, W. A., Jamison, S. P., Knabbe, E-A., MacLeod, A. M., van der Meer, A. F. G., ... Steffen, B. (2007). Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review Letters, 99, 164801-1-164801-5. https://doi.org/10.1103/PhysRevLett.99.164801
    Berden, G. ; Gillespie, W. A. ; Jamison, S. P. ; Knabbe, E.-A. ; MacLeod, A. M. ; van der Meer, A. F. G. ; Phillips, P. J. ; Schlarb, H. ; Schmidt, B. ; Schmüser, P. ; Steffen, B. / Benchmarking of electro-optic monitors for femtosecond electron bunches. In: Physical Review Letters. 2007 ; Vol. 99. pp. 164801-1-164801-5.
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    title = "Benchmarking of electro-optic monitors for femtosecond electron bunches",
    abstract = "The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. {\circledC} 2007 The American Physical Society",
    keywords = "Electron beams, Charge distribution, Electrooptical devices, Ultrashort pulses, Coulomb field, Electrooptic monitors, Radio-frequency structure",
    author = "G. Berden and Gillespie, {W. A.} and Jamison, {S. P.} and E.-A. Knabbe and MacLeod, {A. M.} and {van der Meer}, {A. F. G.} and Phillips, {P. J.} and H. Schlarb and B. Schmidt and P. Schm{\"u}ser and B. Steffen",
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    doi = "10.1103/PhysRevLett.99.164801",
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    Berden, G, Gillespie, WA, Jamison, SP, Knabbe, E-A, MacLeod, AM, van der Meer, AFG, Phillips, PJ, Schlarb, H, Schmidt, B, Schmüser, P & Steffen, B 2007, 'Benchmarking of electro-optic monitors for femtosecond electron bunches', Physical Review Letters, vol. 99, pp. 164801-1-164801-5. https://doi.org/10.1103/PhysRevLett.99.164801

    Benchmarking of electro-optic monitors for femtosecond electron bunches. / Berden, G.; Gillespie, W. A.; Jamison, S. P.; Knabbe, E.-A.; MacLeod, A. M.; van der Meer, A. F. G.; Phillips, P. J.; Schlarb, H.; Schmidt, B.; Schmüser, P.; Steffen, B.

    In: Physical Review Letters, Vol. 99, 10.2007, p. 164801-1-164801-5.

    Research output: Contribution to journalArticle

    TY - JOUR

    T1 - Benchmarking of electro-optic monitors for femtosecond electron bunches

    AU - Berden, G.

    AU - Gillespie, W. A.

    AU - Jamison, S. P.

    AU - Knabbe, E.-A.

    AU - MacLeod, A. M.

    AU - van der Meer, A. F. G.

    AU - Phillips, P. J.

    AU - Schlarb, H.

    AU - Schmidt, B.

    AU - Schmüser, P.

    AU - Steffen, B.

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    N2 - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society

    AB - The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties. © 2007 The American Physical Society

    KW - Electron beams

    KW - Charge distribution

    KW - Electrooptical devices

    KW - Ultrashort pulses

    KW - Coulomb field

    KW - Electrooptic monitors

    KW - Radio-frequency structure

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    DO - 10.1103/PhysRevLett.99.164801

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    Berden G, Gillespie WA, Jamison SP, Knabbe E-A, MacLeod AM, van der Meer AFG et al. Benchmarking of electro-optic monitors for femtosecond electron bunches. Physical Review Letters. 2007 Oct;99:164801-1-164801-5. https://doi.org/10.1103/PhysRevLett.99.164801