Benchmarking of electro-optic monitors for femtosecond electron bunches

G. Berden, W. A. Gillespie, S. P. Jamison, E.-A. Knabbe, A. M. MacLeod, A. F. G. van der Meer, P. J. Phillips, H. Schlarb, B. Schmidt, P. Schmüser, B. Steffen

Research output: Contribution to journal › Article › peer-review