Biomolecular layer thickness evaluation using White Light Reflectance Spectroscopy

M. Kitsara (Lead / Corresponding author), P. Petrou, D. Kontziampasis, K. Misiakos, E. Makarona, I. Raptis, K. Beltsios

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

A White Light Reflectance Spectroscopy (WLRS) methodology is applied in the evaluation of the effectiveness of biomolecules immobilization onto solid surfaces as well as their subsequent reaction with counterpart biomolecules via measuring the respective layers thickness. In particular we investigated the adsorption of rabbit and mouse gamma-globulins as well as their reaction with complementary antibodies. The results obtained with the proposed methodology were compared with those received by atomic force microscopy analysis of the same samples. It was found that the developed method provides a simple, very fast and accurate approach for thin biomolecular layers thickness determination.

Original languageEnglish
Pages (from-to)802-805
Number of pages4
JournalMicroelectronic Engineering
Volume87
Issue number5-8
Early online date22 Nov 2009
DOIs
Publication statusPublished - May 2010

Keywords

  • Atomic force microscopy
  • Biomolecular layer
  • Gamma-globulins
  • Reflectance spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Surfaces, Coatings and Films
  • Electrical and Electronic Engineering

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