Abstract
Two complementary localised density of states spectroscopies, Modulated Photo-Conductivity (MPC) and the Constant Photocurrent Method (CPM) are applied to Ga2O3 thin films and are shown to be sensitive to carrier traps above and below the Fermi level, respectively. These techniques measure the film directly, without requiring a Schottky or p-n junction, which may offer advantages over conventional techniques in the study of high-resistivity or semi-insulating materials. The benefits of a higher-resolution MPC analysis are demonstrated.
Original language | English |
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Article number | 012001 |
Number of pages | 11 |
Journal | Journal of Physics: Conference Series |
Volume | 2952 |
Issue number | 1 |
Early online date | 1 Feb 2025 |
DOIs | |
Publication status | Published - 17 Feb 2025 |
Event | 23rd International School on Condensed Matter Physics (ISCMP 2024): "Recent Progress in Advanced Materials and Applications" - Varna, Bulgaria Duration: 26 Aug 2024 → 30 Aug 2024 Conference number: 23 |