Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth

Steve Reynolds, Reinhard Carius, Friedhelm Finger, Vladimir Smirnov

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    14 Citations (Scopus)

    Abstract

    Photovoltaic properties of 4 mu m thick microcrystalline silicon p-i-n solar cells have been studied, over a range of crystallinity determined using Raman spectroscopy. Low-crystallinity material (below 10%) appears to absorb disproportionately strongly in the infrared, possibly due to increased light scattering or to relaxation of the crystal momentum selection rule. A minimum in solar cell efficiency is observed under AM 1.5 illumination when V-OC approximate to 580 mV, with blue response most strongly affected. This is consistent with a reduction in electron mobility to a value below that of amorphous silicon for low-crystallinity material, in agreement with time-of-flight measurements. (C) 2009 Elsevier B.V. All rights reserved.

    Original languageEnglish
    Pages (from-to)6392-6395
    Number of pages4
    JournalThin Solid Films
    Volume517
    Issue number23
    DOIs
    Publication statusPublished - 1 Oct 2009

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