Correlation of structural and optoelectronic properties of thin film silicon prepared at the transition from microcrystalline to amorphous growth

Steve Reynolds, Reinhard Carius, Friedhelm Finger, Vladimir Smirnov

    Research output: Contribution to journal › Article › peer-review

    14 Citations (Scopus)

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    Keyphrases

    Chemistry

    Engineering

    Material Science

    Physics