@inbook{0cd846e77b5646e4a08c2c097bcd0005,
title = "Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy",
author = "S. Reynolds and C. Main and R. Bruggemann",
note = "Abelson, JR Symposium on Amorphous and Nanocrystalline Silicon-Based Films held at the 2003 MRS Spring Meeting APR 22-25, 2003 SAN FRANCISCO, CALIFORNIA; 2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films ; Conference date: 22-04-2003 Through 25-04-2003",
year = "2003",
language = "English",
isbn = "9781558996991",
volume = "762",
series = "MRS Symposium Proceedings Series",
publisher = "Materials Research Society",
pages = "137--142",
editor = "Abelson, {John R. } and Ganguly, {Gautman } and Matsumura, {Hideki } and Robertson, {John } and Schiff, {Eric A. }",
booktitle = "Amorphous and nanocrystalline silicon-based films-2003",
}