Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy

S. Reynolds, C. Main, R. Bruggemann

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

    1 Citation (Scopus)
    Original languageEnglish
    Title of host publicationAmorphous and nanocrystalline silicon-based films-2003
    EditorsJohn R. Abelson, Gautman Ganguly, Hideki Matsumura, John Robertson, Eric A. Schiff
    PublisherMaterials Research Society
    Pages137-142
    Number of pages6
    Volume762
    ISBN (Print)9781558996991
    Publication statusPublished - 2003
    Event2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films - San Francisco, Ca., United States
    Duration: 22 Apr 200325 Apr 2003

    Publication series

    NameMRS Symposium Proceedings Series
    Volume762

    Conference

    Conference2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films
    CountryUnited States
    CitySan Francisco, Ca.
    Period22/04/0325/04/03

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