Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy

S. Reynolds; C. Main; R. Bruggemann

Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy

S. Reynolds, C. Main, R. Bruggemann

Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed)

Original language	English
Title of host publication	Amorphous and nanocrystalline silicon-based films-2003
Editors	John R. Abelson, Gautman Ganguly, Hideki Matsumura, John Robertson, Eric A. Schiff
Publisher	Materials Research Society
Pages	137-142
Number of pages	6
Volume	762
ISBN (Print)	9781558996991
Publication status	Published - 2003
Event	2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films - San Francisco, Ca., United States Duration: 22 Apr 2003 → 25 Apr 2003

Publication series

Name	MRS Symposium Proceedings Series
Volume	762

Conference

Conference	2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films
Country/Territory	United States
City	San Francisco, Ca.
Period	22/04/03 → 25/04/03

Access to Document

Cite this

Reynolds, S., Main, C., & Bruggemann, R. (2003). Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy. In J. R. Abelson, G. Ganguly, H. Matsumura, J. Robertson, & E. A. Schiff (Eds.), Amorphous and nanocrystalline silicon-based films-2003 (Vol. 762, pp. 137-142). (MRS Symposium Proceedings Series; Vol. 762). Materials Research Society. http://www.cambridge.org/gb/knowledge/isbn/item6522577/?site_locale=en_GB

Reynolds, S. ; Main, C. ; Bruggemann, R. / Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy. Amorphous and nanocrystalline silicon-based films-2003. editor / John R. Abelson ; Gautman Ganguly ; Hideki Matsumura ; John Robertson ; Eric A. Schiff. Vol. 762 Materials Research Society, 2003. pp. 137-142 (MRS Symposium Proceedings Series).

@inbook{0cd846e77b5646e4a08c2c097bcd0005,

title = "Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy",

author = "S. Reynolds and C. Main and R. Bruggemann",

note = "Abelson, JR Symposium on Amorphous and Nanocrystalline Silicon-Based Films held at the 2003 MRS Spring Meeting APR 22-25, 2003 SAN FRANCISCO, CALIFORNIA; 2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films ; Conference date: 22-04-2003 Through 25-04-2003",

year = "2003",

language = "English",

isbn = "9781558996991",

volume = "762",

series = "MRS Symposium Proceedings Series",

publisher = "Materials Research Society",

pages = "137--142",

editor = "Abelson, \{John R. \} and Ganguly, \{Gautman \} and Matsumura, \{Hideki \} and Robertson, \{John \} and Schiff, \{Eric A. \}",

booktitle = "Amorphous and nanocrystalline silicon-based films-2003",

}

Reynolds, S, Main, C & Bruggemann, R 2003, Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy. in JR Abelson, G Ganguly, H Matsumura, J Robertson & EA Schiff (eds), Amorphous and nanocrystalline silicon-based films-2003. vol. 762, MRS Symposium Proceedings Series, vol. 762, Materials Research Society, pp. 137-142, 2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films , San Francisco, Ca., United States, 22/04/03. <http://www.cambridge.org/gb/knowledge/isbn/item6522577/?site_locale=en_GB>

Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy. / Reynolds, S.; Main, C.; Bruggemann, R.
Amorphous and nanocrystalline silicon-based films-2003. ed. / John R. Abelson; Gautman Ganguly; Hideki Matsumura; John Robertson; Eric A. Schiff. Vol. 762 Materials Research Society, 2003. p. 137-142 (MRS Symposium Proceedings Series; Vol. 762).

Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed)

TY - CHAP

T1 - Depth profiling of light-induced defects in hydrogenated amorphous silicon by transient photocurrent spectroscopy

AU - Reynolds, S.

AU - Main, C.

AU - Bruggemann, R.

N1 - Abelson, JR Symposium on Amorphous and Nanocrystalline Silicon-Based Films held at the 2003 MRS Spring Meeting APR 22-25, 2003 SAN FRANCISCO, CALIFORNIA

PY - 2003

Y1 - 2003

M3 - Chapter (peer-reviewed)

SN - 9781558996991

VL - 762

T3 - MRS Symposium Proceedings Series

SP - 137

EP - 142

BT - Amorphous and nanocrystalline silicon-based films-2003

A2 - Abelson, John R.

A2 - Ganguly, Gautman

A2 - Matsumura, Hideki

A2 - Robertson, John

A2 - Schiff, Eric A.

PB - Materials Research Society

T2 - 2003 MRS Spring Meeting. Symposium on Amorphous and Nanocrystalline Silicon-Based Films

Y2 - 22 April 2003 through 25 April 2003

ER -