Original language | English |
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Pages (from-to) | 401-405 |
Number of pages | 5 |
Journal | Solid State Communications |
Volume | 83 |
Issue number | 6 |
DOIs | |
Publication status | Published - 1992 |
Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique
C. Main, R. Bruggemann, D. P. Webb, S. Reynolds
Research output: Contribution to journal › Article › peer-review
66
Citations
(Scopus)