Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique

C. Main, R. Bruggemann, D. P. Webb, S. Reynolds

    Research output: Contribution to journalArticle

    64 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)401-405
    Number of pages5
    JournalSolid State Communications
    Volume83
    Issue number6
    DOIs
    Publication statusPublished - 1992

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