Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique

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@article{35917a08e73c4f0eaf18bf1d234c2fdb,

title = "Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique",

author = "C. Main and R. Bruggemann and Webb, \{D. P.\} and S. Reynolds",

year = "1992",

doi = "10.1016/0038-1098(92)90076-L",

language = "English",

volume = "83",

pages = "401--405",

journal = "Solid State Communications",

issn = "1879-2766",

publisher = "Elsevier",

number = "6",

}

TY - JOUR

T1 - Determination of gap-state distributions in amorphous semiconductors from transient photocurrents using a fourier transform technique

AU - Main, C.

AU - Bruggemann, R.

AU - Webb, D. P.

AU - Reynolds, S.

PY - 1992

Y1 - 1992

U2 - 10.1016/0038-1098(92)90076-L

DO - 10.1016/0038-1098(92)90076-L

M3 - Article

SN - 1879-2766

VL - 83

SP - 401

EP - 405

JO - Solid State Communications

JF - Solid State Communications

IS - 6

ER -