Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds, Charlie Main, Mariana J. Gueorguieva

Research output: Contribution to journalConference articlepeer-review

Abstract

The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

Original languageEnglish
Article numberA22.6
JournalMaterials Research Society Symposium - Proceedings
Volume664
DOIs
Publication statusPublished - 2001
EventAmorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States
Duration: 16 Apr 200120 Apr 2001

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