Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds; Charlie Main; Mariana J. Gueorguieva

doi:10.1557/PROC-664-A22.6

Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds, Charlie Main, Mariana J. Gueorguieva

Research output: Contribution to journal › Conference article

Abstract

The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

Original language	English
Article number	A22.6
Journal	Materials Research Society Symposium - Proceedings
Volume	664
DOIs	https://doi.org/10.1557/PROC-664-A22.6
Publication status	Published - 2001
Event	Amorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States Duration: 16 Apr 2001 → 20 Apr 2001

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Reynolds, S., Main, C., & Gueorguieva, M. J. (2001). Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data. Materials Research Society Symposium - Proceedings, 664, [A22.6]. https://doi.org/10.1557/PROC-664-A22.6

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