The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.
|Journal||Materials Research Society Symposium - Proceedings|
|Publication status||Published - 2001|
|Event||Amorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States|
Duration: 16 Apr 2001 → 20 Apr 2001