Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds; Charlie Main; Mariana J. Gueorguieva

doi:10.1557/PROC-664-A22.6

Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Steve Reynolds, Charlie Main, Mariana J. Gueorguieva

Research output: Contribution to journal › Conference article › peer-review

Abstract

The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

Original language	English
Article number	A22.6
Journal	Materials Research Society Symposium - Proceedings
Volume	664
DOIs	https://doi.org/10.1557/PROC-664-A22.6
Publication status	Published - 2001
Event	Amorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States Duration: 16 Apr 2001 → 20 Apr 2001

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Access to Document

10.1557/PROC-664-A22.6Licence: No Licence / Unknown

Cite this

@article{1cda6df218764baf832fd12f2e43b216,

title = "Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data",

abstract = "The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.",

author = "Steve Reynolds and Charlie Main and Gueorguieva, {Mariana J.}",

year = "2001",

doi = "10.1557/PROC-664-A22.6",

language = "English",

volume = "664",

journal = "Materials Research Society Symposium - Proceedings",

issn = "1946-4274",

publisher = "Cambridge University Press",

note = "Amorphous and Heterogeneous Silicon Based Films 2001 ; Conference date: 16-04-2001 Through 20-04-2001",

}

TY - JOUR

T1 - Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

AU - Reynolds, Steve

AU - Main, Charlie

AU - Gueorguieva, Mariana J.

PY - 2001

Y1 - 2001

N2 - The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

AB - The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.

UR - http://www.scopus.com/inward/record.url?scp=0035556482&partnerID=8YFLogxK

U2 - 10.1557/PROC-664-A22.6

DO - 10.1557/PROC-664-A22.6

M3 - Conference article

AN - SCOPUS:0035556482

SN - 1946-4274

VL - 664

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

M1 - A22.6

T2 - Amorphous and Heterogeneous Silicon Based Films 2001

Y2 - 16 April 2001 through 20 April 2001

ER -

Effect of experimental noise on recovery of the electronic density of states from transient photocurrent data

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this