Abstract
The effects of random noise on density of states determination from transient photocurrent data are examined by superimposing noise levels similar to those found experimentally (1% to 20%) on computer-simulated current-time data. Mathematically approximate methods based on Fourier and Laplace transformations are found to operate effectively at noise levels of up to 20%. Mathematically exact methods offer higher resolution, but this is compromised by greater susceptibility to noise. A Tikhonov regularisation method yields both high resolution and good noise tolerance.
| Original language | English |
|---|---|
| Article number | A22.6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 664 |
| DOIs | |
| Publication status | Published - 2001 |
| Event | Amorphous and Heterogeneous Silicon Based Films 2001 - San Francisco, CA, United States Duration: 16 Apr 2001 → 20 Apr 2001 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
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