Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles

G. Berden, S. P. Jamison, A. M. MacLeod, W. A. Gillespie, B. Redlich, A. F. G. van der Meer

    Research output: Contribution to journalArticlepeer-review

    160 Citations (Scopus)

    Abstract

    Electro-optic detection of the Coulomb field of a relativistic electron bunch combined with single-shot cross correlation of optical pulses is used to enable single-shot measurements of the shape and length of femtosecond electron bunches. This method overcomes a fundamental time-resolution limit of previous single-shot electro-optic measurements, which arises from the inseparability of time and frequency properties of the probing optical pulse. Using this new technique we have made real-time measurements of a 50 MeV electron bunch, observing the profile of 650 fs FWHM (~275??fs rms) long bunches. © 2004 The American Physical Society
    Original languageEnglish
    Pages (from-to)114802-1-114802-4
    JournalPhysical Review Letters
    Volume93
    Issue number11
    DOIs
    Publication statusPublished - Sep 2004

    Keywords

    • Electrooptical effects
    • Femtosecond electron bunches
    • Full width at half-maximum (FWHM)
    • FWHM
    • Optical pulses
    • Spectral decoding

    Fingerprint

    Dive into the research topics of 'Electro-optic technique with improved time resolution for real-time, nondestructive, single-shot measurements of femtosecond electron bunch profiles'. Together they form a unique fingerprint.

    Cite this