Electro-optical bunch profile measurement at CTF3

R. Pan, A. Andersson, W. Farabolini, A.N. Goldblatt, T. Lefevre, M. Martyanov, S. Mazzoni, L. Timeo, S. Rey, S.P. Jamison, W.A. Gillespie, D. Walsh

    Research output: Chapter in Book/Report/Conference proceedingChapter

    2 Citations (Scopus)

    Abstract

    A new electro-optic bunch profile monitor has recently been installed in CLIC Test Facility 3 at CERN. The monitor is based on an electro-optic spectral decoding scheme which reconstructs the longitudinal profile of the electron bunch by measuring its Coulomb field. The system uses a 780 nm fibre laser system, transported over a 20m long distance to the interaction chamber, where a ZnTe crystal is positioned close to the beam. The assembly also contains a traditional OTR screen, which is coupled to a second optical line and used to adjust the temporal overlap between the laser and the electron pulse. This paper presents the detection system in detail, as well as reporting on the first measurements performed with beam.
    Original languageEnglish
    Title of host publicationProceedings of the 4th International Particle Accelerator Conference
    Pages658-660
    Number of pages3
    Publication statusPublished - 2013
    Event4th International Particle Accelerator Conference, 2013 - Shanghai, China
    Duration: 12 May 201317 May 2013
    http://inspirehep.net/record/1241922?ln=en

    Conference

    Conference4th International Particle Accelerator Conference, 2013
    Abbreviated titleIPAC
    CountryChina
    CityShanghai
    Period12/05/1317/05/13
    Internet address

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  • Cite this

    Pan, R., Andersson, A., Farabolini, W., Goldblatt, A. N., Lefevre, T., Martyanov, M., Mazzoni, S., Timeo, L., Rey, S., Jamison, S. P., Gillespie, W. A., & Walsh, D. (2013). Electro-optical bunch profile measurement at CTF3. In Proceedings of the 4th International Particle Accelerator Conference (pp. 658-660)