HEp-2 cells staining patterns classification via wavelet scattering network and random forest

Hongwei Li, Jianguo Zhang (Lead / Corresponding author), Wei-Shi Zheng

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

The classification of HEp- 2 cells staining patterns is a particularly useful task in identifying various autoimmune diseases in medical applications. Conventionally, this task is carried out by specialists' observing under a fluorescence microscope, which depends too heavily on the experience and expertise of the operators. Due to the complexity of these stain patterns, their identification process is often subjective and unreliable [2]. Manual identification of these patterns from a large collection of cell images is very laborious, and often suffers from intrinsic limitations related to visual evaluation performed by human [8]. To overcome these limitations, over the past few years, the automatic classification of HEp- 2 cells staining patterns (as shown in Fig. 1) has attracted increasing attention in computer vision research and various Computer-Aided Diagno-sis(CAD) systems have been designed with image analysis techniques to reduce the labor and time required by the analysis [9], [7]. Although tremendous progress has been made towards improving the identification accuracy of the cell stain patterns, the performances of the state-of-the-art systems are still far from its use by medical practitioners. Thus, automatic classification of the staining patterns has been increasingly demanded.
Original languageEnglish
Title of host publication2015 3rd IAPR Asian Conference on Pattern Recognition (APCR)
Place of PublicationNew York
PublisherIEEE
Pages406-410
Number of pages5
ISBN (Electronic)9781479961009
ISBN (Print)9781479960996
DOIs
Publication statusPublished - 9 Jun 2016
Event3rd IAPR Asian Conference on Pattern Recognition - Aloft Kuala Lumpur Sentral Hotel, Kuala Lumpur, Malaysia
Duration: 3 Nov 20156 Nov 2015
http://acpr2015.org/

Conference

Conference3rd IAPR Asian Conference on Pattern Recognition
Abbreviated titleACPR 2015
Country/TerritoryMalaysia
CityKuala Lumpur
Period3/11/156/11/15
Internet address

Keywords

  • Benchmark testing
  • Feature extraction
  • Scattering
  • Support vector machines
  • Training
  • Vegetation
  • Wavelet transforms

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