Abstract
The classification of HEp- 2 cells staining patterns is a particularly useful task in identifying various autoimmune diseases in medical applications. Conventionally, this task is carried out by specialists' observing under a fluorescence microscope, which depends too heavily on the experience and expertise of the operators. Due to the complexity of these stain patterns, their identification process is often subjective and unreliable [2]. Manual identification of these patterns from a large collection of cell images is very laborious, and often suffers from intrinsic limitations related to visual evaluation performed by human [8]. To overcome these limitations, over the past few years, the automatic classification of HEp- 2 cells staining patterns (as shown in Fig. 1) has attracted increasing attention in computer vision research and various Computer-Aided Diagno-sis(CAD) systems have been designed with image analysis techniques to reduce the labor and time required by the analysis [9], [7]. Although tremendous progress has been made towards improving the identification accuracy of the cell stain patterns, the performances of the state-of-the-art systems are still far from its use by medical practitioners. Thus, automatic classification of the staining patterns has been increasingly demanded.
Original language | English |
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Title of host publication | 2015 3rd IAPR Asian Conference on Pattern Recognition (APCR) |
Place of Publication | New York |
Publisher | IEEE |
Pages | 406-410 |
Number of pages | 5 |
ISBN (Electronic) | 9781479961009 |
ISBN (Print) | 9781479960996 |
DOIs | |
Publication status | Published - 9 Jun 2016 |
Event | 3rd IAPR Asian Conference on Pattern Recognition - Aloft Kuala Lumpur Sentral Hotel, Kuala Lumpur, Malaysia Duration: 3 Nov 2015 → 6 Nov 2015 http://acpr2015.org/ |
Conference
Conference | 3rd IAPR Asian Conference on Pattern Recognition |
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Abbreviated title | ACPR 2015 |
Country/Territory | Malaysia |
City | Kuala Lumpur |
Period | 3/11/15 → 6/11/15 |
Internet address |
Keywords
- Benchmark testing
- Feature extraction
- Scattering
- Support vector machines
- Training
- Vegetation
- Wavelet transforms