Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films

D. J. Keeble, S. Wicklein, R. Dittmann, L. Ravelli, R. A. Mackie, W. Egger

    Research output: Contribution to journalArticlepeer-review

    111 Citations (Scopus)

    Abstract

    Cation vacancies on both sublattices (V-Ti, V-Sr) have been identified in homoepitaxial pulsed laser deposited SrTiO3 films using high intensity variable energy positron annihilation lifetime spectroscopy (PALS) measurements. Film nonstoichiometry was varied by varying laser fluence. PALS showed that on increasing the fluence above the Ti/Sr similar to 1 value, the concentration ratio [V-Sr]/[V-Ti] systematically increased. Reducing the fluence into the Ti-poor region below resulted in additional vacancy cluster defect formation. Vacancy concentrations greater than similar to 50 ppm were observed in all films.

    Original languageEnglish
    Article number226102
    Pages (from-to)-
    Number of pages4
    JournalPhysical Review Letters
    Volume105
    Issue number22
    DOIs
    Publication statusPublished - 23 Nov 2010

    Keywords

    • SRTIO3
    • ELECTRONICS

    Fingerprint

    Dive into the research topics of 'Identification of A- and B-Site Cation Vacancy Defects in Perovskite Oxide Thin Films'. Together they form a unique fingerprint.

    Cite this