Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser

A. H. Quarterman; S. Mirkhanov; C. J. C. Smyth; K. G. Wilcox

doi:10.1063/1.4963352

Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser

A. H. Quarterman (Lead / Corresponding author), S. Mirkhanov, C. J. C. Smyth, K. G. Wilcox

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

191 Downloads (Pure)

Abstract

Accurate characterizations of the nonlinear refractive index of semiconductor disk laser (SDL) gain samples are of critical importance for understanding the behavior of self-mode-locked SDLs. Here we describe measurements of nonlinear lensing in an SDL gain sample for a wide range of optical pump intensities and using a probe which is on resonance with the quantum wells in the SDL gain sample and whose intensity, pulse duration, and spot size are chosen to be similar to those reported in self-mode-locked SDLs. Under these conditions, we determine an effective value of the nonlinear refractive index, n2¼6.5 1013 cm2/W at zero pump intensity, and find that the value of n2 changes by less than 25% over the range of pump intensities studied. The nonlinear refractive index is measured using a variation on the well-established z-scan technique, which was modified to make
it better suited to the measurement of optically pumped samples.

Original language	English
Article number	121113
Number of pages	4
Journal	Applied Physics Letters
Volume	109
Issue number	12
DOIs	https://doi.org/10.1063/1.4963352
Publication status	Published - 19 Sept 2016

Keywords

Quantum wells
Semiconductors
Transmission measurement
Carrier density
Refractive index

Access to Document

10.1063/1.4963352Licence: CC BY

Final Published Version
Copyright 2016 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
Final published version, 860 KBLicence: CC BY

Tuneable Gigahertz Mode Spaced Frequency Combs (Fellowship)
Wilcox, K. (Investigator)
Engineering and Physical Sciences Research Council
1/10/13 → 28/02/18
Project: Research

Open access data for 'Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser', Applied Physics Letters 109, 121113 (2016).
Quarterman, A. H. (Creator), Mirkhanov, S. (Creator), Smyth, C. J. C. (Creator) & Wilcox, K. (Creator), University of Dundee, 2016
DOI: 10.15132/10000113
Dataset

File

Wilcox, Keith
- Physics - Senior Lecturer (Teaching and Research)
Person: Academic

Cite this

@article{34ab7eb8bd7e433b9513771674646254,

title = "Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser",

abstract = "Accurate characterizations of the nonlinear refractive index of semiconductor disk laser (SDL) gain samples are of critical importance for understanding the behavior of self-mode-locked SDLs. Here we describe measurements of nonlinear lensing in an SDL gain sample for a wide range of optical pump intensities and using a probe which is on resonance with the quantum wells in the SDL gain sample and whose intensity, pulse duration, and spot size are chosen to be similar to those reported in self-mode-locked SDLs. Under these conditions, we determine an effective value of the nonlinear refractive index, n2¼6.5 1013 cm2/W at zero pump intensity, and find that the value of n2 changes by less than 25% over the range of pump intensities studied. The nonlinear refractive index is measured using a variation on the well-established z-scan technique, which was modified to makeit better suited to the measurement of optically pumped samples.",

keywords = "Quantum wells, Semiconductors, Transmission measurement, Carrier density, Refractive index",

author = "Quarterman, {A. H.} and S. Mirkhanov and {J. C. Smyth}, C. and Wilcox, {K. G.}",

note = "Funding supporting this work was received from the UK Engineering and Physical Sciences Research Council (EPSRC), Grant No. EP/J017043/2.",

year = "2016",

month = sep,

day = "19",

doi = "10.1063/1.4963352",

language = "English",

volume = "109",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "12",

}

TY - JOUR

T1 - Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser

AU - Quarterman, A. H.

AU - Mirkhanov, S.

AU - J. C. Smyth, C.

AU - Wilcox, K. G.

N1 - Funding supporting this work was received from the UK Engineering and Physical Sciences Research Council (EPSRC), Grant No. EP/J017043/2.

PY - 2016/9/19

Y1 - 2016/9/19

N2 - Accurate characterizations of the nonlinear refractive index of semiconductor disk laser (SDL) gain samples are of critical importance for understanding the behavior of self-mode-locked SDLs. Here we describe measurements of nonlinear lensing in an SDL gain sample for a wide range of optical pump intensities and using a probe which is on resonance with the quantum wells in the SDL gain sample and whose intensity, pulse duration, and spot size are chosen to be similar to those reported in self-mode-locked SDLs. Under these conditions, we determine an effective value of the nonlinear refractive index, n2¼6.5 1013 cm2/W at zero pump intensity, and find that the value of n2 changes by less than 25% over the range of pump intensities studied. The nonlinear refractive index is measured using a variation on the well-established z-scan technique, which was modified to makeit better suited to the measurement of optically pumped samples.

AB - Accurate characterizations of the nonlinear refractive index of semiconductor disk laser (SDL) gain samples are of critical importance for understanding the behavior of self-mode-locked SDLs. Here we describe measurements of nonlinear lensing in an SDL gain sample for a wide range of optical pump intensities and using a probe which is on resonance with the quantum wells in the SDL gain sample and whose intensity, pulse duration, and spot size are chosen to be similar to those reported in self-mode-locked SDLs. Under these conditions, we determine an effective value of the nonlinear refractive index, n2¼6.5 1013 cm2/W at zero pump intensity, and find that the value of n2 changes by less than 25% over the range of pump intensities studied. The nonlinear refractive index is measured using a variation on the well-established z-scan technique, which was modified to makeit better suited to the measurement of optically pumped samples.

KW - Quantum wells

KW - Semiconductors

KW - Transmission measurement

KW - Carrier density

KW - Refractive index

U2 - 10.1063/1.4963352

DO - 10.1063/1.4963352

M3 - Article

SN - 0003-6951

VL - 109

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 12

M1 - 121113

ER -

Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser

Abstract

Keywords

Access to Document

Fingerprint

Projects

Tuneable Gigahertz Mode Spaced Frequency Combs (Fellowship)

Datasets

Open access data for 'Measurements of nonlinear lensing in a semiconductor disk laser gain sample under optical pumping and using a resonant femtosecond probe laser', Applied Physics Letters 109, 121113 (2016).

Profiles

Wilcox, Keith

Cite this