Method of reducing photoelectron yield and/or secondary electron yield of a ceramic surface; corresponding apparatus and product

TY - PAT

T1 - Method of reducing photoelectron yield and/or secondary electron yield of a ceramic surface; corresponding apparatus and product

AU - Abdolvand, Amin

PY - 2017/9/14

Y1 - 2017/9/14

N2 - A method of reducing photoelectron yield (PEY) and/or secondary electron yield (SEY) of a ceramic surface comprises applying pulsed laser radiation comprising a series of laser pulses emitted by a laser (4) to the surface of a target (10) to produce a periodic arrangement of structures on the surface of the target (10).

AB - A method of reducing photoelectron yield (PEY) and/or secondary electron yield (SEY) of a ceramic surface comprises applying pulsed laser radiation comprising a series of laser pulses emitted by a laser (4) to the surface of a target (10) to produce a periodic arrangement of structures on the surface of the target (10).

UR - https://patentscope.wipo.int/search/en/detail.jsf?docId=WO2017153750&recNum=1&office=&queryString=FP%3A%28METHOD+OF+REDUCING+PHOTOELECTRON+YIELD+AND%2FOR+SECONDARY+ELECTRON+YIELD+OF+A+CERAMIC+SURFACE%3B+CORRESPONDING+APPARATUS+AND+PRODUCT%29&prevFilter=&sortOption=Pub+Date+Desc&maxRec=2

M3 - Patent

M1 - WO 2017/153750 Al

Y2 - 2017/03/08

ER -