TY - JOUR
T1 - Numerical modeling of thermally-stimulated currents for the density-of-states determination in thin-film semiconductors
AU - Main, C.
AU - Souffi, N.
AU - Reynolds, S.
AU - Bruggemann, R.
PY - 2006/6
Y1 - 2006/6
N2 - The paper reports on thermally stimulated conductivity studies used for characterization of the density of states profile in thin film semiconductors, by numerically solving the non-linear time-dependent rate equations for free and trapped charge. We explore the derivation of energy and density scales from temperature and conductivity data. We examine the distinction between ‘strong’ and ‘weak’ re-trapping and the use of low ‘effective’ values of attempt-to-escape frequencies in establishing an energy scale, and the ad hoc inclusion of a temperature-dependent lifetime. It is confirmed for several illustrative model systems that the technique can afford surprisingly good fidelity in recovery of the density of states under a range of conditions.
AB - The paper reports on thermally stimulated conductivity studies used for characterization of the density of states profile in thin film semiconductors, by numerically solving the non-linear time-dependent rate equations for free and trapped charge. We explore the derivation of energy and density scales from temperature and conductivity data. We examine the distinction between ‘strong’ and ‘weak’ re-trapping and the use of low ‘effective’ values of attempt-to-escape frequencies in establishing an energy scale, and the ad hoc inclusion of a temperature-dependent lifetime. It is confirmed for several illustrative model systems that the technique can afford surprisingly good fidelity in recovery of the density of states under a range of conditions.
U2 - 10.1016/j.jnoncrysol.2005.11.127
DO - 10.1016/j.jnoncrysol.2005.11.127
M3 - Article
SN - 1873-4812
VL - 352
SP - 1028
EP - 1031
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
IS - 9-20
ER -