Keyphrases
Localized States
100%
A-Si
100%
Transient Photocurrent
100%
Semiconductors
100%
Plasma-enhanced Chemical Vapor Deposition (PECVD)
100%
Laplace Transform
100%
Photocurrent Spectroscopy
100%
State Distribution
100%
Cadmium Telluride
100%
Light Soaking
100%
Exact Solutions
50%
Regularization Method
50%
Defect Density
50%
Single Crystal
50%
Rate Equations
50%
Multiple Trapping
50%
Trapping Rate
50%
Tikhonov Regularization
50%
Conduction Band Edge
50%
Narrowband
50%
Laplace
50%
Exact Method
50%
Electronic Density of States
50%
Narrow Distribution
50%
Tin-doped
50%
Engineering
Transients
100%
Localized State
100%
Photocurrent
100%
Chemical Vapor Deposition
100%
Vapor Deposition
100%
Laplace Transform
100%
Defect Density
50%
Rate Equation
50%
Conduction Band Edge
50%
Preliminary Analysis
50%
Regularization
50%
Input Data
50%
Electronic State
50%
Physics
Photoelectric Emission
100%
Vapor Deposition
100%
Blood Plasma
100%
Transients
100%
Conduction Band
50%
Single Crystal
50%
Material Science
Film
100%
Plasma-Enhanced Chemical Vapor Deposition
100%
Density
50%
Defect Density
50%
Tin
50%
Single Crystal
50%