Relationship between phase shift, square-wave response and density of states in modulated photocurrent spectroscopy

S. Reynolds, C. Main

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

    Original languageEnglish
    Title of host publicationAmorphous and polycrystalline thin-film silicon science and technology - 2006
    Subtitle of host publicationsymposium held April 18-21, 2006, San Francisco, California, U.S.A.
    EditorsSigurd Wagner
    Place of PublicationWarrendale, Pennslyvania
    PublisherMaterials Research Society
    Pages239-244
    Number of pages6
    Volume910
    ISBN (Print)9781558998667
    Publication statusPublished - 2007
    EventSymposium A: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - San Francisco, United States
    Duration: 17 Apr 200621 Apr 2006
    http://www.mrs.org/s06-program-a/

    Publication series

    NameMaterials Research Society symposia proceedings
    Volume910

    Conference

    ConferenceSymposium A: Amorphous and Polycrystalline Thin-Film Silicon Science and Technology
    CountryUnited States
    CitySan Francisco
    Period17/04/0621/04/06
    Internet address

    Cite this

    Reynolds, S., & Main, C. (2007). Relationship between phase shift, square-wave response and density of states in modulated photocurrent spectroscopy. In S. Wagner (Ed.), Amorphous and polycrystalline thin-film silicon science and technology - 2006: symposium held April 18-21, 2006, San Francisco, California, U.S.A. (Vol. 910, pp. 239-244). (Materials Research Society symposia proceedings; Vol. 910). Materials Research Society. http://www.mrs.org/s06-program-a/