Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping

Fan Wang; Wen Jun Toe; Woei Ming Lee; David McGloin; Qiang Gao; Hark Hoe Tan; Chennupati Jagadish; Peter J. Reece

doi:10.1021/nl304607v

Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping

Fan Wang, Wen Jun Toe, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece (Lead / Corresponding author)

Research output: Contribution to journal › Article › peer-review

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Abstract

Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 µm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.

Original language	English
Pages (from-to)	1185-1191
Number of pages	7
Journal	Nano Letters
Volume	13
Issue number	3
DOIs	https://doi.org/10.1021/nl304607v
Publication status	Published - 13 Mar 2013

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title = "Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping",

abstract = "Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 µm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.",

author = "Fan Wang and Toe, {Wen Jun} and Lee, {Woei Ming} and David McGloin and Qiang Gao and Tan, {Hark Hoe} and Chennupati Jagadish and Reece, {Peter J.}",

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doi = "10.1021/nl304607v",

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T1 - Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping

AU - Wang, Fan

AU - Toe, Wen Jun

AU - Lee, Woei Ming

AU - McGloin, David

AU - Gao, Qiang

AU - Tan, Hark Hoe

AU - Jagadish, Chennupati

AU - Reece, Peter J.

PY - 2013/3/13

Y1 - 2013/3/13

N2 - Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 µm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.

AB - Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 µm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.

U2 - 10.1021/nl304607v

DO - 10.1021/nl304607v

M3 - Article

C2 - 23394286

SN - 1530-6984

VL - 13

SP - 1185

EP - 1191

JO - Nano Letters

JF - Nano Letters

IS - 3

ER -

Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping

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