Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping

Fan Wang, Wen Jun Toe, Woei Ming Lee, David McGloin, Qiang Gao, Hark Hoe Tan, Chennupati Jagadish, Peter J. Reece (Lead / Corresponding author)

    Research output: Contribution to journalArticle

    28 Citations (Scopus)

    Abstract

    Axially resolved microphotoluminescence mapping of semiconductor nanowires held in an optical tweezers reveals important new experimental information regarding equilibrium trapping points and trapping stability of high aspect ratio nanostructures. In this study, holographic optical tweezers are used to scan trapped InP nanowires along the beam direction with respect to a fixed excitation source and the luminescent properties are recorded. It is observed that nanowires with lengths on the range of 3-15 µm are stably trapped near the tip of the wire with the long segment positioned below the focus in an inverted trapping configuration. Through the use of trap multiplexing we investigate the possibility of improving the axial stability of the trapped nanowires. Our results have important implication for applications of optically assisted nanowire assembly and optical tweezers based scanning probes microscopy.
    Original languageEnglish
    Pages (from-to)1185-1191
    Number of pages7
    JournalNano Letters
    Volume13
    Issue number3
    DOIs
    Publication statusPublished - 13 Mar 2013

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    Wang, F., Toe, W. J., Lee, W. M., McGloin, D., Gao, Q., Tan, H. H., Jagadish, C., & Reece, P. J. (2013). Resolving stable axial trapping points of nanowires in an optical tweezers using photoluminescence mapping. Nano Letters, 13(3), 1185-1191. https://doi.org/10.1021/nl304607v