Role of surface microgeometries on electron escape probability and secondary electron yield of metal surfaces

D. Bajek, S. Wackerow, D. A. Zanin, L. Baudin, K. Bogdanowicz, E. Garcia-Tabares Valdivieso, S. Calatroni, B. Di Girolamo, M. Sitko, M. Himmerlich, M. Taborelli, P. Chiggiato, A. Abdolvand (Lead / Corresponding author)