Abstract
Lateral growth crystallization of hydrogenated amorphous silicon with single and multiple pulse excitation using a Nd:YAG laser at a wavelength of 532 nm and a 3 ns pulse width at a repetition of 10 Hz is shown. With single pulse crystallization, large grain sizes of the order of 1 µm were obtained with an energy density >400 mJ/cm2, and these have been studied using transmission electron microscopy (TEM) and atomic force microscopy. We show that, by using extremely short (3 ns) multiple pulse excitation of significantly lower powers (<150 mJ/cm2), than that used to crystallize amorphous silicon with single pulse excitation, a uniform growth of crystalline grains is observed. TEM gives evidence for lateral grain growth with multiple pulse crystallization at low energies. We suggest that a "super sequential lateral growth" mechanism is occurring. © 2001 American Institute of Physics.
Original language | English |
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Pages (from-to) | 186-188 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 78 |
Issue number | 2 |
DOIs | |
Publication status | Published - Jan 2001 |
Keywords
- Thin-film transistors
- Interference crystallization
- Polycrystalline silicon
- Grain-growth
- SI films
- A-SI
- Glass