Abstract
Variable energy positron annihilation lifetime spectroscopy of high-mobility La-doped SrTiO3 grown by molecular beam epitaxy found that the films contained sufficiently low concentrations of Sr vacancies and vacancy cluster defects to allow the observation of positron annihilation events from the perfect lattice. This enabled the concentrations of charged cation vacancies to be estimated, and these were found to be at least an order of magnitude below the La-dopant concentrations. (C) 2011 American Institute of Physics. [doi:10.1063/1.3664398]
Original language | English |
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Article number | 232905 |
Pages (from-to) | - |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 99 |
Issue number | 23 |
DOIs | |
Publication status | Published - 5 Dec 2011 |
Keywords
- POSITRON TRAPPING RATES
- SILICON