Abstract
Propagation invariant, 'non-diffracting' beams have found numerous applications in areas as diverse as filamentation, trapping, and photoporation. However, the prominent transverse structure of Bessel beams prevents localized illumination, thus hampering its use for high resolution imaging with an extended focus. We investigate the relationship between axial resolution, contrast, and propagation invariance for single and two-photon fluorescence light sheet microscopy.
Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Subtitle of host publication | Complex Light and Optical Forces VII |
Publisher | SPIE-International Society for Optical Engineering |
Volume | 8637 |
ISBN (Print) | 9780819494061 |
DOIs | |
Publication status | Published - 6 Jun 2013 |
Event | 7th Conference on Complex Light and Optical Forces - San Francisco, CA, United States Duration: 5 Feb 2013 → 7 Feb 2013 |
Conference
Conference | 7th Conference on Complex Light and Optical Forces |
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Country/Territory | United States |
City | San Francisco, CA |
Period | 5/02/13 → 7/02/13 |
Keywords
- Bessel beam
- extended field-of-view
- high resolution
- light sheet fluorescence microscopy (LSFM)
- propagation-invariance
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering