Towards Oxide Electronics: a Roadmap

M. Coll; J. Fontcuberta; M. Althammer; M. Bibes; H. Boschker; A. Calleja; G. Cheng; M. Cuoco; R. Dittmann; B. Dkhil; I. El Baggari; M. Fanciulli; I. Fina; E. Fortunato; C. Frontera; S. Fujita; V. Garcia; S. T.B. Goennenwein; C. G. Granqvist; J. Grollier; R. Gross; A. Hagfeldt; G. Herranz; K. Hono; E. Houwman; M. Huijben; A. Kalaboukhov; D. J. Keeble; G. Koster; L. F. Kourkoutis; J. Levy; M. Lira-Cantu; J. L. MacManus-Driscoll; Jochen Mannhart; R. Martins; S. Menzel; T. Mikolajick; M. Napari; M. D. Nguyen; G. Niklasson; C. Paillard; S. Panigrahi; G. Rijnders; F. Sánchez; P. Sanchis; S. Sanna; D. G. Schlom; U. Schroeder; K. M. Shen; A. Siemon; M. Spreitzer; H. Sukegawa; R. Tamayo; J. van den Brink; N. Pryds; F. Miletto Granozio

doi:10.1016/j.apsusc.2019.03.312

Towards Oxide Electronics: a Roadmap

M. Coll, J. Fontcuberta, M. Althammer, M. Bibes, H. Boschker, A. Calleja, G. Cheng, M. Cuoco, R. Dittmann, B. Dkhil, I. El Baggari, M. Fanciulli, I. Fina, E. Fortunato, C. Frontera, S. Fujita, V. Garcia, S. T.B. Goennenwein, C. G. Granqvist, J. GrollierR. Gross, A. Hagfeldt, G. Herranz, K. Hono, E. Houwman, M. Huijben, A. Kalaboukhov, D. J. Keeble, G. Koster, L. F. Kourkoutis, J. Levy, M. Lira-Cantu, J. L. MacManus-Driscoll, Jochen Mannhart, R. Martins, S. Menzel, T. Mikolajick, M. Napari, M. D. Nguyen, G. Niklasson, C. Paillard, S. Panigrahi, G. Rijnders, F. Sánchez, P. Sanchis, S. Sanna, D. G. Schlom, U. Schroeder, K. M. Shen, A. Siemon, M. Spreitzer, H. Sukegawa, R. Tamayo, J. van den Brink, N. Pryds, F. Miletto Granozio

Physics

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Abstract

The current status of experimental point defect characterization of oxide thin films is briefly reviewed. The primary focus is on complex oxides, in particular perovskite oxide thin films. The evidence from different point defect sensitive characterization methods, such as electron paramagnetic resonance, positron annihilation spectroscopy, and optical spectroscopy is evaluated. Current and future challenges for point defect characterization of perovskite oxide films are detailed and suggestions for further work to aid the development of electronic grade complex oxide thin films are given.

Original language	English
Pages (from-to)	1-93
Number of pages	93
Journal	Applied Surface Science
Volume	482
Early online date	19 Apr 2019
DOIs	https://doi.org/10.1016/j.apsusc.2019.03.312
Publication status	Published - 15 Jul 2019

Keywords

Point defects
Oxide materials
Defect characterization

ASJC Scopus subject areas

Surfaces, Coatings and Films

Access to Document

10.1016/j.apsusc.2019.03.312

Final Published VersionFinal published version, 12.1 MBLicence: CC BY-NC-ND

Cite this

Coll, M., Fontcuberta, J., Althammer, M., Bibes, M., Boschker, H., Calleja, A., Cheng, G., Cuoco, M., Dittmann, R., Dkhil, B., El Baggari, I., Fanciulli, M., Fina, I., Fortunato, E., Frontera, C., Fujita, S., Garcia, V., Goennenwein, S. T. B., Granqvist, C. G., ... Granozio, F. M. (2019). Towards Oxide Electronics: a Roadmap. Applied Surface Science, 482, 1-93. https://doi.org/10.1016/j.apsusc.2019.03.312

@article{4c3cd2c84bcd4cbb86da849e27d6b94d,

title = "Towards Oxide Electronics: a Roadmap",

abstract = "The current status of experimental point defect characterization of oxide thin films is briefly reviewed. The primary focus is on complex oxides, in particular perovskite oxide thin films. The evidence from different point defect sensitive characterization methods, such as electron paramagnetic resonance, positron annihilation spectroscopy, and optical spectroscopy is evaluated. Current and future challenges for point defect characterization of perovskite oxide films are detailed and suggestions for further work to aid the development of electronic grade complex oxide thin films are given.",

keywords = "Point defects, Oxide materials, Defect characterization",

author = "M. Coll and J. Fontcuberta and M. Althammer and M. Bibes and H. Boschker and A. Calleja and G. Cheng and M. Cuoco and R. Dittmann and B. Dkhil and {El Baggari}, I. and M. Fanciulli and I. Fina and E. Fortunato and C. Frontera and S. Fujita and V. Garcia and Goennenwein, {S. T.B.} and Granqvist, {C. G.} and J. Grollier and R. Gross and A. Hagfeldt and G. Herranz and K. Hono and E. Houwman and M. Huijben and A. Kalaboukhov and Keeble, {D. J.} and G. Koster and Kourkoutis, {L. F.} and J. Levy and M. Lira-Cantu and MacManus-Driscoll, {J. L.} and Jochen Mannhart and R. Martins and S. Menzel and T. Mikolajick and M. Napari and Nguyen, {M. D.} and G. Niklasson and C. Paillard and S. Panigrahi and G. Rijnders and F. S{\'a}nchez and P. Sanchis and S. Sanna and Schlom, {D. G.} and U. Schroeder and Shen, {K. M.} and A. Siemon and M. Spreitzer and H. Sukegawa and R. Tamayo and {van den Brink}, J. and N. Pryds and Granozio, {F. Miletto}",

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doi = "10.1016/j.apsusc.2019.03.312",

language = "English",

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journal = "Applied Surface Science",

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Coll, M, Fontcuberta, J, Althammer, M, Bibes, M, Boschker, H, Calleja, A, Cheng, G, Cuoco, M, Dittmann, R, Dkhil, B, El Baggari, I, Fanciulli, M, Fina, I, Fortunato, E, Frontera, C, Fujita, S, Garcia, V, Goennenwein, STB, Granqvist, CG, Grollier, J, Gross, R, Hagfeldt, A, Herranz, G, Hono, K, Houwman, E, Huijben, M, Kalaboukhov, A, Keeble, DJ, Koster, G, Kourkoutis, LF, Levy, J, Lira-Cantu, M, MacManus-Driscoll, JL, Mannhart, J, Martins, R, Menzel, S, Mikolajick, T, Napari, M, Nguyen, MD, Niklasson, G, Paillard, C, Panigrahi, S, Rijnders, G, Sánchez, F, Sanchis, P, Sanna, S, Schlom, DG, Schroeder, U, Shen, KM, Siemon, A, Spreitzer, M, Sukegawa, H, Tamayo, R, van den Brink, J, Pryds, N & Granozio, FM 2019, 'Towards Oxide Electronics: a Roadmap', Applied Surface Science, vol. 482, pp. 1-93. https://doi.org/10.1016/j.apsusc.2019.03.312

TY - JOUR

T1 - Towards Oxide Electronics

T2 - a Roadmap

AU - Coll, M.

AU - Fontcuberta, J.

AU - Althammer, M.

AU - Bibes, M.

AU - Boschker, H.

AU - Calleja, A.

AU - Cheng, G.

AU - Cuoco, M.

AU - Dittmann, R.

AU - Dkhil, B.

AU - El Baggari, I.

AU - Fanciulli, M.

AU - Fina, I.

AU - Fortunato, E.

AU - Frontera, C.

AU - Fujita, S.

AU - Garcia, V.

AU - Goennenwein, S. T.B.

AU - Granqvist, C. G.

AU - Grollier, J.

AU - Gross, R.

AU - Hagfeldt, A.

AU - Herranz, G.

AU - Hono, K.

AU - Houwman, E.

AU - Huijben, M.

AU - Kalaboukhov, A.

AU - Keeble, D. J.

AU - Koster, G.

AU - Kourkoutis, L. F.

AU - Levy, J.

AU - Lira-Cantu, M.

AU - MacManus-Driscoll, J. L.

AU - Mannhart, Jochen

AU - Martins, R.

AU - Menzel, S.

AU - Mikolajick, T.

AU - Napari, M.

AU - Nguyen, M. D.

AU - Niklasson, G.

AU - Paillard, C.

AU - Panigrahi, S.

AU - Rijnders, G.

AU - Sánchez, F.

AU - Sanchis, P.

AU - Sanna, S.

AU - Schlom, D. G.

AU - Schroeder, U.

AU - Shen, K. M.

AU - Siemon, A.

AU - Spreitzer, M.

AU - Sukegawa, H.

AU - Tamayo, R.

AU - van den Brink, J.

AU - Pryds, N.

AU - Granozio, F. Miletto

PY - 2019/7/15

Y1 - 2019/7/15

N2 - The current status of experimental point defect characterization of oxide thin films is briefly reviewed. The primary focus is on complex oxides, in particular perovskite oxide thin films. The evidence from different point defect sensitive characterization methods, such as electron paramagnetic resonance, positron annihilation spectroscopy, and optical spectroscopy is evaluated. Current and future challenges for point defect characterization of perovskite oxide films are detailed and suggestions for further work to aid the development of electronic grade complex oxide thin films are given.

AB - The current status of experimental point defect characterization of oxide thin films is briefly reviewed. The primary focus is on complex oxides, in particular perovskite oxide thin films. The evidence from different point defect sensitive characterization methods, such as electron paramagnetic resonance, positron annihilation spectroscopy, and optical spectroscopy is evaluated. Current and future challenges for point defect characterization of perovskite oxide films are detailed and suggestions for further work to aid the development of electronic grade complex oxide thin films are given.

KW - Point defects

KW - Oxide materials

KW - Defect characterization

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U2 - 10.1016/j.apsusc.2019.03.312

DO - 10.1016/j.apsusc.2019.03.312

M3 - Article

AN - SCOPUS:85064343610

SN - 0169-4332

VL - 482

SP - 1

EP - 93

JO - Applied Surface Science

JF - Applied Surface Science

ER -

Towards Oxide Electronics: a Roadmap

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Keeble, David

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Towards Oxide Electronics: a Roadmap

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Keywords

ASJC Scopus subject areas

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Keeble, David

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