Towards Oxide Electronics: a Roadmap

M. Coll, J. Fontcuberta, M. Althammer, M. Bibes, H. Boschker, A. Calleja, G. Cheng, M. Cuoco, R. Dittmann, B. Dkhil, I. El Baggari, M. Fanciulli, I. Fina, E. Fortunato, C. Frontera, S. Fujita, V. Garcia, S. T.B. Goennenwein, C. G. Granqvist, J. GrollierR. Gross, A. Hagfeldt, G. Herranz, K. Hono, E. Houwman, M. Huijben, A. Kalaboukhov, D. J. Keeble, G. Koster, L. F. Kourkoutis, J. Levy, M. Lira-Cantu, J. L. MacManus-Driscoll, Jochen Mannhart, R. Martins, S. Menzel, T. Mikolajick, M. Napari, M. D. Nguyen, G. Niklasson, C. Paillard, S. Panigrahi, G. Rijnders, F. Sánchez, P. Sanchis, S. Sanna, D. G. Schlom, U. Schroeder, K. M. Shen, A. Siemon, M. Spreitzer, H. Sukegawa, R. Tamayo, J. van den Brink, N. Pryds, F. Miletto Granozio

Research output: Contribution to journalArticlepeer-review

93 Citations (Scopus)
287 Downloads (Pure)

Abstract

The current status of experimental point defect characterization of oxide thin films is briefly reviewed. The primary focus is on complex oxides, in particular perovskite oxide thin films. The evidence from different point defect sensitive characterization methods, such as electron paramagnetic resonance, positron annihilation spectroscopy, and optical spectroscopy is evaluated. Current and future challenges for point defect characterization of perovskite oxide films are detailed and suggestions for further work to aid the development of electronic grade complex oxide thin films are given.
Original languageEnglish
Pages (from-to)1-93
Number of pages93
JournalApplied Surface Science
Volume482
Early online date19 Apr 2019
DOIs
Publication statusPublished - 15 Jul 2019

Keywords

  • Point defects
  • Oxide materials
  • Defect characterization

Fingerprint Dive into the research topics of 'Towards Oxide Electronics: a Roadmap'. Together they form a unique fingerprint.

Cite this