Transport and Meyer-Neldel rule in microcrystalline silicon films

S. Reynolds, V. Smirnov, F. Finger, C. Main, R. Carius

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

    3 Citations (Scopus)
    Original languageEnglish
    Title of host publicationAmorphous and Nanocrystalline Silicon Science and Technology-2005
    Subtitle of host publicationSymposium March 28-April 1, 2005, San Francisco, California, U.S.A.
    EditorsRobert W. Collins
    Place of PublicationWarrendale, Pa
    PublisherMaterials Research Society
    Pages525-530
    Number of pages6
    ISBN (Print)1558998152
    Publication statusPublished - Apr 2005
    EventSymposium A: Amorphous and Nanocrystalline Silicon Science and Technology - San Francisco, United States
    Duration: 28 Mar 20051 Apr 2005
    http://www.mrs.org/s05-program-a/

    Publication series

    NameMaterials Research Society symposium proceedings
    Volume862

    Conference

    ConferenceSymposium A: Amorphous and Nanocrystalline Silicon Science and Technology
    CountryUnited States
    CitySan Francisco
    Period28/03/051/04/05
    Internet address

    Cite this

    Reynolds, S., Smirnov, V., Finger, F., Main, C., & Carius, R. (2005). Transport and Meyer-Neldel rule in microcrystalline silicon films. In R. W. Collins (Ed.), Amorphous and Nanocrystalline Silicon Science and Technology-2005: Symposium March 28-April 1, 2005, San Francisco, California, U.S.A. (pp. 525-530). (Materials Research Society symposium proceedings; Vol. 862). Warrendale, Pa: Materials Research Society.
    Reynolds, S. ; Smirnov, V. ; Finger, F. ; Main, C. ; Carius, R. / Transport and Meyer-Neldel rule in microcrystalline silicon films. Amorphous and Nanocrystalline Silicon Science and Technology-2005: Symposium March 28-April 1, 2005, San Francisco, California, U.S.A.. editor / Robert W. Collins. Warrendale, Pa : Materials Research Society, 2005. pp. 525-530 (Materials Research Society symposium proceedings).
    @inbook{010062b2e91840b9918a47c6aa45b2ff,
    title = "Transport and Meyer-Neldel rule in microcrystalline silicon films",
    author = "S. Reynolds and V. Smirnov and F. Finger and C. Main and R. Carius",
    year = "2005",
    month = "4",
    language = "English",
    isbn = "1558998152",
    series = "Materials Research Society symposium proceedings",
    publisher = "Materials Research Society",
    pages = "525--530",
    editor = "Collins, {Robert W.}",
    booktitle = "Amorphous and Nanocrystalline Silicon Science and Technology-2005",

    }

    Reynolds, S, Smirnov, V, Finger, F, Main, C & Carius, R 2005, Transport and Meyer-Neldel rule in microcrystalline silicon films. in RW Collins (ed.), Amorphous and Nanocrystalline Silicon Science and Technology-2005: Symposium March 28-April 1, 2005, San Francisco, California, U.S.A.. Materials Research Society symposium proceedings, vol. 862, Materials Research Society, Warrendale, Pa, pp. 525-530, Symposium A: Amorphous and Nanocrystalline Silicon Science and Technology, San Francisco, United States, 28/03/05.

    Transport and Meyer-Neldel rule in microcrystalline silicon films. / Reynolds, S.; Smirnov, V.; Finger, F.; Main, C.; Carius, R.

    Amorphous and Nanocrystalline Silicon Science and Technology-2005: Symposium March 28-April 1, 2005, San Francisco, California, U.S.A.. ed. / Robert W. Collins. Warrendale, Pa : Materials Research Society, 2005. p. 525-530 (Materials Research Society symposium proceedings; Vol. 862).

    Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

    TY - CHAP

    T1 - Transport and Meyer-Neldel rule in microcrystalline silicon films

    AU - Reynolds, S.

    AU - Smirnov, V.

    AU - Finger, F.

    AU - Main, C.

    AU - Carius, R.

    PY - 2005/4

    Y1 - 2005/4

    M3 - Chapter (peer-reviewed)

    SN - 1558998152

    T3 - Materials Research Society symposium proceedings

    SP - 525

    EP - 530

    BT - Amorphous and Nanocrystalline Silicon Science and Technology-2005

    A2 - Collins, Robert W.

    PB - Materials Research Society

    CY - Warrendale, Pa

    ER -

    Reynolds S, Smirnov V, Finger F, Main C, Carius R. Transport and Meyer-Neldel rule in microcrystalline silicon films. In Collins RW, editor, Amorphous and Nanocrystalline Silicon Science and Technology-2005: Symposium March 28-April 1, 2005, San Francisco, California, U.S.A.. Warrendale, Pa: Materials Research Society. 2005. p. 525-530. (Materials Research Society symposium proceedings).