X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40−xS60 films

R. K. Debnath, Sandy Fitzgerald, K. Christova

    Research output: Contribution to journalArticlepeer-review

    7 Citations (Scopus)

    Abstract

    THE MATHEMATICAL SYMBOLS/SPECIAL CHARACTERS IN THIS ABSTRACT CANNOT BE DISPLAYED CORRECTLY ON THIS PAGE. PLEASE REFER TO THE ABSTRACT ON THE PUBLISHER’S WEBSITE FOR AN ACCURATE DISPLAY. X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin GexSb40-xS60 films (x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag2S and Ag2O are likely to form due to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.
    Original languageEnglish
    Pages (from-to)261-265
    Number of pages5
    JournalApplied Surface Science
    Volume202
    Issue numberIssues 3-4
    DOIs
    Publication statusPublished - 2002

    Keywords

    • Amorphous thin films
    • X-ray photoelectron spectroscopy
    • Antimony
    • Silver

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