X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40−xS60 films

TY - JOUR

T1 - X-ray photoelectron spectroscopy studies of Ag-doped thin amorphous GexSb40−xS60 films

AU - Debnath, R. K.

AU - Fitzgerald, Sandy

AU - Christova, K.

N1 - dc.publisher: Elsevier dc.description.sponsorship: EPSRC (research grant GR/N14682)

PY - 2002

Y1 - 2002

N2 - THE MATHEMATICAL SYMBOLS/SPECIAL CHARACTERS IN THIS ABSTRACT CANNOT BE DISPLAYED CORRECTLY ON THIS PAGE. PLEASE REFER TO THE ABSTRACT ON THE PUBLISHER’S WEBSITE FOR AN ACCURATE DISPLAY. X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin GexSb40-xS60 films (x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag2S and Ag2O are likely to form due to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.

AB - THE MATHEMATICAL SYMBOLS/SPECIAL CHARACTERS IN THIS ABSTRACT CANNOT BE DISPLAYED CORRECTLY ON THIS PAGE. PLEASE REFER TO THE ABSTRACT ON THE PUBLISHER’S WEBSITE FOR AN ACCURATE DISPLAY. X-ray photoelectron spectroscopy has been used to determine the binding energies of the core electrons in Ag-doped amorphous thin GexSb40-xS60 films (x=15, 20, 25 and 27). Chemical shifts of the constituent elements have revealed that electrons are transferred from chalcogenide to metal and compounds such as Ag2S and Ag2O are likely to form due to photo-induced chemical modification and oxidation, respectively. Charge defects are induced in the amorphous system.

KW - Amorphous thin films

KW - X-ray photoelectron spectroscopy

KW - Antimony

KW - Silver

U2 - 10.1016/S0169-4332(02)00946-7

DO - 10.1016/S0169-4332(02)00946-7

M3 - Article

SN - 1873-5584

VL - 202

SP - 261

EP - 265

JO - Applied Surface Science

JF - Applied Surface Science

IS - Issues 3-4

ER -